Key parameters
- point resolution: 2.0 Å,
- TEM resolution limit 1.02 Å
- STEM HAADF resolution: 0.17 nm
- Cs= 1.2 mm
- Cc=2 mm
- thin window EDS spectrometer for quantitative nanoanalysis
- Lorenz lens
- electron holography Biprism
- Gatan GIF system (Tridiem 863 UHS)
The optimized compromise between high resolution and high tilt angles allows this instrument to be used in state-of-the-art research laboratories specialized in materials analysis. With its FEG source, fine probe techniques (such as STEM with an HAADF detector) can be performed with ease. In addition, the flexibility of the high voltage of 300 kV allows users to select optimal operating conditions for each experiment, while exceeding even the highest attainable resolution of dedicated 200 kV systems.
As an analytical TEM (ATEM), the F30 can do not only bright-field, dark-field, high-resolution TEM images and diffraction, but also electron holography to map the electric and magnetic field distribution and electron tomography to explore the three-dimensional information of samples, X-ray energy dispersive spectroscopy (EDS) mapping and electron energy-loss spectroscopy (EELS) mapping.
Sample holders
- CompuStage Single-tilt Holder
- CompuStage Low-background Double-tilt Holder
- Tomography Holder (High Field of View)
- Gatan Heating Holder
- Gatan Cryo-holder
- Wildfire in Situ Heating holder
- FEI NanoEX 3D TEM/STM specimen holder (Prof. Matthew McDowell’s Lab)
- Protochips liquid cell holder (January, 2019)
