Energy Dispersive X-ray Spectroscopy (EDS) is a chemical analysis method that can be coupled with the two major electron beam based techniques of Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Scanning
SEM-Quanta , SEM-Fera , TEM-Tecnai , TEM-Jeol – are microscopes which is available in the LEM.
SEM-Quanta、SEM-Fera、TEM-Tecnai、TEM-Jeol – 是 文中提到的显微镜
Disclaimer: The use of our reverse engineering technologies is strictly limited within legal purposes, e.g. reproduce PCB artworks for old or obsolete printed circuit boards where the original is no longer available, PCB & Design tutorial or research and etc. Fast PCB Studio would not be responsible for any legal disputes for any inappropriate use of our technology on commercial competition, patent duplication or other prohibited use of reverse engineering technology by local laws.
20 years of experience have accumulated repeated practical experience
Professional team with top-level expert team
High-quality service, insisting on efficient and fast service standardization operations for many years
Advanced equipment, with multiple FIB equipment
Leading technology, chip decryption solution has many exclusive solutions
ADD: ROOM 2-1212 BAOLONG BUILDING,WANLIU BRIDGE FENGTAI DIST. BEJING CHINA
PHONE: +8613161304058
EMAIL: XINPETE@GMAIL.COM