The FEI CM 200ST is a scanning electron microscope (SEM) that is used to image and analyze solid samples at the atomic level. It has the following key specifications:
- Electron gun: Thermal field emission gun, electron beam energy of 0.1-30 keV
- Sample chamber: Vacuum of 10-10 Torr
- Objective lenses: 3 objectives, magnification of 10-300,000
- Detectors: 2 detectors for secondary electron (SE), backscattered electron (BSE), and energy-dispersive X-ray (EDS) imaging
The FEI CM 200ST can be used for a variety of applications, including:
- Materials science: Studying the structure, composition, and properties of materials
- Biology: Studying the structure and function of biological samples
- Semiconductors: Studying the structure and performance of semiconductor devices
- Nanotechnology: Studying the structure and properties of nanomaterials
Here are some examples of typical applications of the FEI CM 200ST:
- Studying the grain structure of metallic materials Grain structure of metallic materials, taken with FEI CM 200ST
- Studying the membrane structure of biological cells Membrane structure of biological cells, taken with FEI CM 200ST
- Studying the transistor structure of semiconductor devices Transistor structure of semiconductor devices, taken with FEI CM 200ST
- Studying the nanostructure of nanomaterials Nanostructure of nanomaterials, taken with FEI CM 200ST
The FEI CM 200ST is a powerful SEM that can be used for a variety of applications. It has high resolution and sensitivity, allowing it to image and analyze solid samples at the atomic level.
FEI CM 200ST 是一款扫描电子显微镜（SEM），用于在原子级别上成像和分析固体样品。它具有以下主要参数：
电子枪：热阴极枪，电子束能量为 0.1-30 keV
样品室：真空度为 10-10 Torr
物镜：3 个物镜，放大倍率为 10-300,000
探测器：2 个探测器，用于二次电子（SE）、背散射电子（BSE）和能量色散 X 射线（EDS）成像
FEI CM 200ST 可用于多种应用，包括：
材料科学：研究材料的结构、成分和性能
生物学：研究生物样品的结构和功能
半导体：研究半导体器件的结构和性能
纳米技术：研究纳米材料的结构和特性
以下是一些 FEI CM 200ST 的典型应用示例：
研究金属材料的晶粒结构
研究生物细胞的膜结构
研究半导体器件的晶体管结构
研究纳米材料的纳米结构