FEI DualBeam 835 Main Applications The FEI DualBeam 835 is a dual-beam microscope manufactured by FEI. It combines the functions of a scanning electron microscope (SEM) and a focused ion beam (FIB), making it a versatile tool for a wide range of materials science and industrial applications.
The FEI HELIOS 400 is a transmission electron microscope (TEM) manufactured by FEI. It is the flagship product of FEI's HELIOS series of TEMs and features high resolution, high sensitivity, and high stability.